IEEE Transactions on Electron Devices

Results: 26



#Item
11Emerging technologies / Nanomaterials / MOSFET / Silicon dioxide / Amorphous silicon / Electronic band structure / Quantum dot / Crystal / Nanowire / Chemistry / Physics / Materials science

696 IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 62, NO. 3, MARCH 2015 Atomic Level Modeling of Extremely Thin Silicon-on-Insulator MOSFETs Including

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Source URL: yangtze.hku.hk

Language: English - Date: 2015-04-21 18:39:08
12Electronic engineering / Image sensors / Noise / Active pixel sensor / Wide dynamic range / Photodiode / CMOS / Fixed-pattern noise / Image sensor / Digital photography / Electronics / Optics

1108 IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 58, NO. 4, APRIL 2011 Linear–Logarithmic CMOS Pixel With Tunable Dynamic Range

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Source URL: www.iris.sssup.it

Language: English - Date: 2014-12-25 16:36:26
13Nanowire / Quantum mechanics / Emerging technologies / MOSFET / Threshold voltage / Transistor / Carbon nanotube field-effect transistor / Gallium nitride / Multigate device / Physics / Chemistry / Nanoelectronics

IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 60, NO. 7, JULY[removed]Model Order Reduction for Multiband Quantum Transport Simulations and its Application to

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Source URL: yangtze.hku.hk

Language: English - Date: 2013-09-27 06:35:42
14Dietary minerals / Reducing agents / Ceramic materials / Zinc oxide / Oxide thin film transistor / Thin-film transistor / Gallium nitride / Boron / Doping / Chemistry / Inorganic compounds / Chemical elements

IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 59, NO. 2, FEBRUARY[removed]Zinc-Oxide Thin-Film Transistor With Self-Aligned Source/Drain Regions Doped With Implanted

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Source URL: www.pskl.ust.hk

Language: English - Date: 2014-10-10 02:44:38
15Zinc oxide / Annealing / Zinc / Electrical resistivity and conductivity / Heat treating / Center of Excellence in Nanotechnology at AIT / Chemistry / Ceramic materials / Ultraviolet radiation

IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 61, NO. 4, APRIL[removed]The Resistivity of Zinc Oxide Under Different Annealing Configurations and Its Impact on

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Source URL: www.pskl.ust.hk

Language: English - Date: 2014-10-10 02:44:41
16Semiconductor devices / Integrated circuits / High electron mobility transistor / Transistor / Monolithic microwave integrated circuit / Gallium nitride / Field-effect transistor / MOSFET / MESFET / Electronic engineering / Electronics / Technology

1764 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOL. 60, NO. 6, JUNE 2012 A Review of GaN on SiC High Electron-Mobility Power Transistors and MMICs

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Source URL: www.cree.com

Language: English - Date: 2014-05-08 10:01:10
17High electron mobility transistor / Field-effect transistor / MODFET / Double heterostructure / Transistor / Threshold voltage / MESFET / Transconductance / Semiconductor / Electronics / Technology / Electromagnetism

646 IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 36. NO. 4, APRIL 1989 A Recessed-Gate In,.52A10.48As/n+-1%.53G%. 4 7 A ~ MIS-type FET

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Source URL: www-mtl.mit.edu

Language: English - Date: 2013-04-16 14:15:15
18Semiconductor device fabrication / Anions / Silicide / Materials science / Platinum silicide / Titanium disilicide / Salicide / MOSFET / Polycrystalline silicon / Chemistry / Matter / Silicon

1170 IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 55, NO. 5, MAY 2008 Evaluation of Transmission Line Model Structures for Silicide-to-Silicon Specific

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Source URL: doc.utwente.nl

Language: English - Date: 2011-08-28 12:36:23
19Semiconductor devices / Field-effect transistor / Contact resistance / Threshold voltage / Floating Gate MOSFET / Transistor / JFET / Depletion and enhancement modes / Self-aligned gate / Electrical engineering / Technology / Electromagnetism

2386 IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 36. NO. II. NOVEMBER 1989 A Floating-Gate Transmission-Line Model Technique for Measuring Source Resistance in Heterostructure

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Source URL: www-mtl.mit.edu

Language: English - Date: 2013-04-16 14:15:16
20Nanomaterials / Emerging technologies / Superhard materials / Graphene / Bilayer graphene / Field-effect transistor / Silicon carbide / Electron mobility / MOSFET / Chemistry / Physics / Materials science

IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 57, NO. 3, MARCH[removed]Electron Transport in Graphene From a Diffusion-Drift Perspective

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Source URL: www.nrl.navy.mil

Language: English - Date: 2013-11-22 16:02:47
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